JEOL: Launch of the New Benchtop Scanning Electron Microscope “JCM-7000Plus NeoScope™”

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (President & CEO: Izumi Oi) has developed the benchtop scanning electron microscope (SEM) “JCM-7000Plus” and will begin sales on September 1, 2026.

[Development Background]

Benchtop scanning electron microscopes are increasingly used in fields including electrical and electronics, automotive and machinery, steel and metals, chemical and pharmaceuticals. They are utilized not only in research and development but also in manufacturing-related applications, such as quality control and product inspection. In addition, they are adopted in educational settings at middle and high schools as well as universities. Given these diverse applications, there is growing demand for improved operational efficiency, simpler and more automated operation, and enhanced observation, analysis, and measurement performance.

To meet these needs, we have expanded the landing voltage (accelerating voltage) to 20 kV. This has improved resolution to 6 nm, enabling measurements at higher magnification.

On the software side, the new JCM-7000Plus retains the simple, user-friendly GUI of the current JCM-7000, including Zeromag, which enables a seamless transition from optical imaging to SEM observation, and the Live Analysis function, which allows real-time elemental analysis during observation. It also adds the enhanced automation feature Neo Action.

In addition to the three existing Live functions (Live Analysis, Live Map, and Live 3D), we have added two new features: Live Particle, which automatically measures particle size and count in real time while observing, and Live Report, which automatically acquires data and generates reports while moving the field of view, a feature available in high-end FE-SEMs. These features simplify routine tasks, making them more intuitive and efficient while significantly supporting users' analytical workflows.

[Main Features]

1. Expanding landing voltage to 20 kV for improved resolution (secondary electron image: 6 nm, backscattered electron image: 8 nm)

2. Improved backscattered electron detector for enhanced image quality

3. New Live Particle function automatically measures particle size and count, simplifying workflow

4. Live Report enables data acquisition and report creation while moving the field of view, improving work efficiency

5. Simple and user-friendly GUI retained, with added automation functions for more intuitive and easier operation

[Sales target]

300 units/year

[Related link]

Product Information: JCM-7000Plus NeoScope™ Benchtop SEM
https://www.jeol.com/products/scientific/sem/jcm-7000plus.php