AUSTIN, Texas--(BUSINESS WIRE)--NI (Nasdaq: NATI), the provider of a software-defined platform that helps accelerate the development and performance of automated test and automated measurement systems, today announced and demonstrated a quad-site mmWave 5G packaged test solution developed in collaboration with Tessolve and Johnstech.
Addressing the technical challenges associated with 5G mmWave package part test, this solution helps reduce the cost and risk of delaying time to market for semiconductor manufacturers that produce mmWave 5G ICs. NI, Tessolve and Johnstech collaborated to demonstrate a quad-site mmWave 5G IC packaged part test solution that includes a mmWave interface board designed and manufactured by Tessolve and mmWave contactors designed by Johnstech and rated up to 100 GHz.
“Tessolve understands the importance of 5G technology and is actively investing to support the test efforts of our leading customers,” said Raja Manickam, CEO of Tessolve. “We are working closely with NI and their new mmWave instrumentation to help our customers get their mmWave products to market quickly.”
A key element of the solution is the NI Semiconductor Test System (STS). Part of the demonstration included a multisite mmWave test STS configuration optimized for 5G power amplifiers, beamformers and transceivers. A major benefit displayed was the modularity that allows reuse of software and baseband/IF instrumentation with modular mmWave radio heads to address current and future mmWave frequency bands of interest.
The solution features:
- An STS for quad-site mmWave 5G test
- A mmWave-ready test interface board designed and manufactured by Tessolve
- Tessolve holistic silicon design and test process expertise to help maximize product yield
- Johnstech mmWave contactors for final test of packaged parts
- A Johnstech impedance-controlled socket featuring IQtouch Micro contactors to help ensure repeatable test measurements
“We already see the rapidly growing 5G mmWave opportunity and have been involved in multiple projects for mmWave test with the highest quality contactor technology,” said David Johnson, CEO of Johnstech. “With NI, we see more opportunity in this area, especially in manufacturing test where they provide excellent mmWave measurements with ATE test speed.”
Semiconductor manufacturers interested in the solution are encouraged to speak with their sales representatives for the companies involved or email firstname.lastname@example.org for more information. You also can find STS information at ni.com/sts.
NI (ni.com) develops high-performance automated test and automated measurement systems to help you solve your engineering challenges now and into the future. Our open, software-defined platform uses modular hardware and an expansive ecosystem to help you turn powerful possibilities into real solutions.
National Instruments, NI and ni.com are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.
Tessolve is a leading end-to-end solution provider, from chip design, test and PCB engineering through embedded systems development. We enable customers with a faster time-to-market through deep domain expertise in Analog, Digital, Mixed Signal, and RF, broad ATE platform experience and built-in infrastructure including a test floor, characterization, reliability lab and PCB FAB. Tessolve allows customers to leverage high end engineering in a cost-effective model by being able to scale teams to meet exact customer needs. Contact Tessolve whenever from wherever at email@example.com.
JOHNSTECH INTERNATIONAL is a global R&D leader in the field of microcircuit testing, providing reliable, cost-effective testing solutions for automotive, commercial and industrial applications. Founded in 1991 by David Johnson, Johnstech works hand-in-hand with the world’s most respected OSATs, foundries and EDA companies to develop the most precise and dependable test contactors and test sockets in the marketplace today. Email us at firstname.lastname@example.org for more information.