-

JEOL: Release of the New Gas Chromatograph – Time-of-flight Mass Spectrometer JMS-T2000GC AccuTOF(TM) GC-Alpha – the Ultimate GC-MS With Superior Performance and Ease of Operation

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of JMS-T2000GC "AccuTOF(TM) GC-Alpha", the latest model of the successful AccuTOF(TM) GC series gas chromatograph – time-of-flight mass spectrometers, to be released in February 2021. This product is a GC-MS that represents a significant improvement in performance and functionality using two newly developed Key Technologies. The basic hardware performance has been greatly improved and a new generation of automated data analysis software is included in the standard configuration.

Main Features

Two new Key Technologies

Key Technology 1: New high-performance hardware

The JMS-T2000GC "AccuTOF(TM) GC-Alpha", the 6th generation of the successful AccuTOF(TM) GC series, achieves three times the mass resolving power and mass measurement accuracy of the previous "AccuTOF(TM) GCx-plus" by using a whole new ion optics design that achieves excellent sensitivity and high data acquisition speed, the long-time hallmarks for the AccuTOF(TM) GC series. Additionally, the system has a wide dynamic range that is beneficial not only for quantitative analysis but also for qualitative analysis of complex mixtures.

A wide variety of ionization techniques – field ionization (FI), field desorption (FD), photoionization (PI), and chemical ionization (CI) – are optionally available, in addition to the standard electron ionization (EI). Two combination ion sources are also available as options – the EI/FI/FD combination ion source and the EI/PI combination ion source which allow easy switching between ionization techniques without breaking vacuum or replacing the ion sources.

Key Technology 2: A new generation of analysis software for simple, speedy operation (msFineAnalysis)

The msFineAnalysis software is a new generation of automated data analysis software that provides qualitative results by combining data acquired by EI and soft ionization (FI, CI, or PI) in a simple, speedy and automated way. This software makes full use of the high-quality data obtained by the JMS-T2000GC "AccuTOF(TM) GC-Alpha", thus providing a new approach to qualitative analysis for identification of unknown compounds.

The new two-sample comparison function provides Volcano Plots, which can visually illustrate the distinguishing components between the two samples. After determining whether there are differences, integrated analysis is performed for all components. The software also supports analysis of GC/EI data alone.

Annual unit sales target
50 units/year

JMS-T2000GC AccuTOF(TM) GC-Alpha
URL: https://www.jeol.co.jp/en/products/detail/JMS-T2000GC.html

JEOL Ltd.
3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan
Izumi Oi, President & COO
(Stock code: 6951, Tokyo Stock Exchange First Section)
www.jeol.com

Contacts

JEOL Ltd.
Science and Measurement Instruments Sales Division
SI Sales Promotion Department
MS Group
Toshihito YAMAMOTO
+81-3-6262-3575
E-mail: toyamamo@jeol.co.jp
https://www.jeol.co.jp/en/support/support_system/contact_products.html

JEOL Ltd.

TOKYO:6951


Contacts

JEOL Ltd.
Science and Measurement Instruments Sales Division
SI Sales Promotion Department
MS Group
Toshihito YAMAMOTO
+81-3-6262-3575
E-mail: toyamamo@jeol.co.jp
https://www.jeol.co.jp/en/support/support_system/contact_products.html

More News From JEOL Ltd.

JEOL: New CROSS SECTION POLISHER™ IB-19540CP / IB-19550CCP Released

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President and CEO: Izumi Oi) announces the release of the New CROSS SECTION POLISHER™ IB-19540CP / COOLING CROSS SECTION POLISHER™ IB-19550CCP for Electron Microscopes on September 4, 2024. CROSS SECTION POLISHER™(CP)is widely utilized in the fields of electronic parts, ceramics, life science, metal, battery, and polymer. The mechanical high-quality uniform cross section can be easily prepared for complex materials and fragile specimens. With a sal...

JEOL : New Schottky Field Emission Scanning Electron Microscope JSM-IT810 Released

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President and CEO: Izumi Oi) announces the release of the new Schottky Field Emission Scanning Electron Microscope JSM-IT810 on July 28, 2024. Field Emission Scanning Electron Microscopes (FESEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis. The JSM-IT810...

JEOL : - A Useful Tool for Every User! - New Electron Microscope JEM-120i Released

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President and CEO: Izumi Oi) announces the release of the new electron microscope JEM-120i developed with the concepts of “Compact”, “Easy To Use”, and “Expandable” on May 30, 2024. Electron microscopes are utilized in a wide range of fields from biotechnology to nano technology, polymers, and advanced materials. With the expansion of application, usages are also expanding, which requires a tool that is easy-to-use for research and testing purposes...
Back to Newsroom