SANBlaze Announces the Industry’s Highest Density NVMe Gen4 PCIe Test System

LITTLETON, Mass.--(BUSINESS WIRE)--SANBlaze Technology, the leader in NVMe SSD testing, announced today the availability of the SBExpress-RM4 NVMe Gen4 PCIe test platform, the industry’s highest density NVMe Gen4 PCIe test system, with up to 16 devices in a 3U rack space. SBExpress-RM4 and the Certified by SANBlaze (SBCert) test suite have become the industry benchmark for NVMe compliance testing with over 400 built-in tests for true "plug and play" qualification of single and dual port NVMe devices.

SANBlaze SBExpress-RM4, a sixteen-bay solution with hot-plug and Gen1 to Gen4 speed support, is an enterprise class Gen4 NVMe test appliance. The SBExpress-RM4 is available in 4, 8 and 16 device configurations allowing the flexibility to purchase at a value level for a small work group up to a full 16 device configuration for enterprise level qualification.

All SANBlaze SBExpress-RM4 Gen4 systems use a modular "riser" design allowing each of the 16 slots to support single or dual port NVMe drives. Each slot is switchable between dual and single port right from the software for ease of testing both drive types in any configuration. All risers support power control and measurement, with NVMe device configurations that include U.2, U.3, M.2 and EDSFF.

“Our latest SBExpress-RM4 appliance allows customers to mix and match dual and single port drives on the fly through our software-controlled system,” said Vince Asbridge, Founder and President, SANBlaze. “Our modular architecture provides the ability to switch between single and dual port drives on the fly and provides our customers with flexibility for future expansion as needed. The ability to margin and measure power, glitch signals, and test SSC or conventional clocking in both common and SRIS/SRNS modes sets the SBExpress-RM4 apart from all others in the Gen4 NVMe SSD testing space.”

Fully integrated SANBlaze risers from Quarch Technology add fine-grained control for PCIe signal and clock glitching required during Design Verification Testing (DVT). Integrated Quarch technology puts the control of signal glitching and pull/plug testing under control of the Certified by SANBlaze test suite.

Data integrity is verified with a full suite of read/write/compare tests with exception cases such as power glitching while running IO, and built-in "Write Atomicity" testing as part of the Certified by SANBlaze test suite. All feature testing is accessible via a web interface to the appliance.

The SANBlaze SBExpress Gen4 software includes UNH IOL test scripts allowing you to perform IOL testing in your own lab before undergoing official testing. The “Certified by SANBlaze” stamp of approval gives you and your customers high confidence in the integrity of your NVMe devices.

The SANBlaze SBExpress Gen4 software can also run on your own qualified hardware. Contact SANBlaze for availability and pricing by visiting our website: https://www.sanblaze.com/