AUSTIN, Texas--(BUSINESS WIRE)--NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced it will demonstrate new, smarter microwave design and test solutions that address the entire product lifecycle at the IEEE MTT-S International Microwave Symposium (IMS2016) in San Francisco, Booth 1529, May 22-27.
Developing next-generation Internet of Things (IoT) wireless devices and 5G infrastructure challenges the way engineers develop smaller, faster and smarter products. In semiconductor, the push for smaller and more integrated devices is leading to smarter methodologies and flows for RF design and test. In aerospace and defense applications, electronic systems are at a crossroads of increasing system complexity and legacy hardware compatibility.
To efficiently address all phases of product development, customers can take advantage of the innovative design and test solutions from NI based on AWR Design Environment™ software, LabVIEW and PXI. NI solutions showcased at IMS2016, include:
- New measurement solutions for 802.11ax - high-efficiency WLAN (HEW) - devices
- Advances in NI AWR software design solutions for power amplifier, antenna, filter and radar systems through new automation and tool interoperability
- Advanced solutions for RFIC test, from lab-based characterization systems to high-volume manufacturing test solutions
- Advanced millimeter wave technology for channel sounding and 5G prototyping
NI President, CEO and Cofounder Dr. James Truchard will deliver the closing keynote titled Software’s Role in Next-Generation 5G RF and Microwave Systems on Thursday, May 26 at 4:30 p.m. Dr. Truchard will explore the vital role of a software-based approach to power the explosion of wireless communications for high-data-rate voice, data and video applications, from early prototyping and research all the way to fully deployed systems.
NI will deliver 13 presentations at the MicroApps Theater, in addition to a panel session titled The 5G IoT Conundrum featuring Eric Starkloff, NI executive vice president of global sales and marketing, on Wednesday, May 25 at noon.
For more information about NI’s participation at IMS2016, visit http://sine.ni.com/nievents/app/overview/p/eventId/33960/site/nic/country/us/lang/en/scope/country/location/us
About NI
Since 1976, NI (www.ni.com) has made it possible for engineers and scientists to solve the world’s greatest engineering challenges with powerful platform-based systems that accelerate productivity and drive rapid innovation. Customers from a wide variety of industries – from healthcare to automotive and from consumer electronics to particle physics – use NI’s integrated hardware and software platform to improve the world we live in.
LabVIEW, National Instruments, NI and ni.com are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.
