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Samsung Canada and Collective Arts Announce the Three Winners of Samsung True North Tunes

TORONTO--(BUSINESS WIRE)--Samsung Canada, in partnership with Collective Arts, today named the three inaugural grand finale winners of Samsung True North Tunes along with three curator picks, marking a new chapter for a national artist-development program that attracted over 2,000 artist submissions from across the country. The three winners were recognized as Fan Favourites selected based on votes across social media and the Samsung True North Tunes website. Apart from the grand finale winners...
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ANV Completes Acquisition of Assured Underwriting Group

NEW YORK--(BUSINESS WIRE)--ANV Group Holdings Ltd. (“ANV”), a global insurance intermediary platform, today announced it has completed its acquisition of Assured Underwriting Group Limited (“AUG”), a specialist MGA providing insurance-backed financial protection products to tour operators and the travel sector across the United Kingdom and Europe. The transaction has received all necessary regulatory approvals. Founded in 1983 and headquartered in London, AUG is the UK’s leading underwriter of...
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AFSA Education Foundation Launches All-New MoneySKILL® Personal Finance Curriculum

WASHINGTON--(BUSINESS WIRE)--AFSA Education Foundation launches a new version of its free MoneySKILL® curriculum with interactive features, additional content, and updated tools....
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As First Dupixent MDL Hearing Opens, Weitz & Luxenberg Points to Sanofi’s Own Words on a Cancer That Hides Behind Eczema

NEW YORK--(BUSINESS WIRE)--Weitz & Luxenberg, which represents more people in the Dupixent litigation than any other firm, appeared this past Friday at the first hearing in the federal multidistrict litigation over allegations that Dupixent (dupilumab) can cause, accelerate or unmask cutaneous T-cell lymphoma (CTCL). Judge Zahid N. Quraishi of the U.S. District Court for the District of New Jersey held the initial case management conference for In re: Dupixent (dupilumab) Products Liability...
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JEOL – Lançamento comercial do HAXIS: o novo microscópio eletrônico de varredura com fresagem iônica de baixo ângulo

TÓQUIO--(BUSINESS WIRE)--A JEOL Ltd. (Presidente e CEO Izumi Oi) anuncia o desenvolvimento de seu novo microscópio eletrônico de varredura com fresagem iônica de baixo ângulo, o HAXIS, e iniciará as vendas em 5 de outubro de 2026. Microscópio eletrônico de varredura com fresagem iônica de ângulo baixo HAXIS Contexto do desenvolvimento À medida que as estruturas avançadas de dispositivos semicondutores continuam a diminuir e a se tornar mais complexas, tornou-se difícil estabelecer contato e rea...
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JEOL:HAXIS上市銷售:全新低角度離子研磨掃描電子顯微鏡

東京--(BUSINESS WIRE)--(美國商業資訊)-- JEOL Ltd.(總裁兼執行長:Izumi Oi)宣布開發出全新的低角度離子研磨掃描電子顯微鏡HAXIS,並將於2026年10月5日開始銷售。 HAXIS低角度離子研磨掃描電子顯微鏡 研發背景 隨著先進半導體元件結構不斷縮小並日趨複雜,使用奈米操縱器對微尺度電路進行接觸與量測變得越來越困難。此外,探針接觸可能會影響分析對象,因此需要新的失效分析方法。 JEOL長期致力於被動電壓對比(PVC)偵測技術的研究,並透過探測器與樣品製備技術的進步,建立了一套穩定、高再現性的PVC觀察技術方法。 HAXIS正是JEOL融合上述技術打造的全新半導體失效分析平台。 即便面對先進半導體,HAXIS也能實現清晰、高再現性的PVC觀察。它在盡可能減小加工損傷與污染影響的同時,以視覺化方式檢出電學異常,從而高效定位缺陷位置並判定成因。採用惰性氣體氬氣(Ar)可確保穩定的表面品質,並降低運行成本。 PVC觀察的品質在很大程度上受層次去除(delayering)後樣品表面狀態的影響。HAXIS採用獨一無二的、以氬氣離子束為基礎的低角度離子研磨(L...
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JEOL: Markteinführung von HAXIS: Das neue Rasterelektronenmikroskop mit Low-Angle-Ionenfräsen

TOKIO--(BUSINESS WIRE)--JEOL Ltd. (Präsident und CEO Izumi Oi) gibt die Entwicklung seines neuen Rasterelektronenmikroskops mit Low-Angle-Ionenfräsen, HAXIS, bekannt und wird am 5. Oktober 2026 mit dem Verkauf beginnen. HAXIS – Rasterelektronenmikroskop mit Low-Angle-Ionenfräsen Hintergrund der Entwicklung Da die Strukturen moderner Halbleiterbauelemente immer kleiner und komplexer werden, ist es zunehmend schwierig geworden, mikroskalige Schaltkreise mit Nanomanipulatoren zu berühren und zu me...
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Riassunto: JEOL annuncia il lancio commerciale di HAXIS, il nuovo microscopio elettronico a scansione con fresatura ionica ad angolazione ridotta

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (president e CEO: Izumi Oi) annuncia lo sviluppo di HAXIS, il nuovo microscopio elettronico a scansione con fresatura ionica, con inizio delle vendite previsto per il 5 ottobre 2026. Microscopio elettronico a scansione con fresatura ionica ad angolazione ridotta HAXIS Contesto dello sviluppo Con la continua miniaturizzazione e la sempre maggiore complessità delle strutture dei dispositivi a semiconduttore avanzati, il contatto e la misurazione dei circuiti su s...
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JEOL:HAXIS新品上市:全新低角度离子铣削扫描电子显微镜

东京--(BUSINESS WIRE)--(美国商业资讯)-- JEOL Ltd.(总裁兼首席执行官:Izumi Oi)宣布开发出全新的低角度离子铣削扫描电子显微镜HAXIS,并将于2026年10月5日开始销售。 HAXIS低角度离子铣削扫描电子显微镜 开发背景 随着先进半导体器件结构持续微缩并日趋复杂,使用纳米操纵器对微观电路进行接触与测量变得越来越困难。此外,探针接触可能会影响分析对象,因此需要新的失效分析方法。 JEOL长期致力于被动电压反差(PVC)检测技术的研究,并通过探测器与样品制备技术的进步,建立了一套稳定、高度可重复的PVC观察技术方法。 HAXIS正是JEOL融合上述技术打造的全新半导体失效分析平台。 即便面对先进半导体,HAXIS也能实现清晰且高度可重复的PVC观察。它在尽可能减小加工损伤与污染影响的同时,以可视化方式检出电学异常,从而高效定位缺陷位置并判定成因。采用惰性气体氩(Ar)可确保稳定的表面质量,并降低运行成本。 PVC观察的质量在很大程度上受去层(delayering)后样品表面状态的影响。HAXIS采用独一无二的、基于氩离子束的低角度离子铣削(LIM)...
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SES Announces Final Results of Its Cash Tender Offer

LUXEMBOURG--(BUSINESS WIRE)--THIS ANNOUNCEMENT RELATES TO THE DISCLOSURE OF INFORMATION THAT QUALIFIED OR MAY HAVE QUALIFIED AS INSIDE INFORMATION WITHIN THE MEANING OF ARTICLE 7(1) OF THE MARKET ABUSE REGULATION (EU) 596/2014. NOT FOR RELEASE, PUBLICATION OR DISTRIBUTION IN OR INTO OR TO ANY PERSON LOCATED OR RESIDENT IN, OR AT ANY ADDRESS IN, THE UNITED STATES OF AMERICA, ITS TERRITORIES AND POSSESSIONS (INCLUDING PUERTO RICO, THE U.S. VIRGIN ISLANDS, GUAM, AMERICAN SAMOA, WAKE ISLAND AND THE...