Nanometrics Opens Singapore Advanced Metrology Center

MILPITAS, Calif.--(BUSINESS WIRE)--Nanometrics Incorporated (Nasdaq: NANO), a leading provider of advanced metrology systems, today announced the opening of its Singapore Advanced Metrology Center, an applications development center for customers using Nanometrics metrology systems. The center provides dedicated support throughout Asia for customers requiring advanced modeling of complex structures and recipe development. Nanometrics investment and commitment to additional applications resources reflects the rapid growth and adoption of optical critical dimension (OCD) technology in semiconductor manufacturing due to smaller, more complex structures and new materials.

“Singapore offers a deep talent base, and will serve as a gateway to all of our customers in Asia”

The Singapore location provides access to a large pool of technical talent and a significant concentration of the company’s customers. In addition to applications development staff, the facility also includes sales and service support for Nanometrics customers. It also serves as a training center for regional customers and Nanometrics’ branch offices.

“This expansion is important to our efforts to improve responsiveness in Asia and to better serve our customers,” said Nagesh Avadhany, vice president of applications engineering and training programs. “We are pleased to have a highly-skilled local staff of engineers and scientists who now form the core of our regional applications team. They bring to Nanometrics a vital resource to build our customers’ confidence in our ability to enable their most critical structures.”

“Singapore offers a deep talent base, and will serve as a gateway to all of our customers in Asia,” said Timothy J. Stultz, president and chief executive officer. “This significant commitment to our customers in the region will help us serve them as a more local company, with improved access and communication. We look forward to expanding relationships with our customers, as we grow our team in Singapore.”

About Nanometrics

Nanometrics is a leading provider of advanced, high-performance process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com.

Forward Looking Statements

This press release contains forward-looking statements including, but not limited to, statements regarding the capabilities of the company’s metrology products and technological leadership. Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, expectations regarding product capabilities are subject to a number of risks, including changes in customer spending plans, worldwide economic conditions and the continued technological leadership of our products. For additional information and considerations regarding the risks faced by Nanometrics, see its annual report on Form 10-K for the year ended January 1, 2011 as filed with the Securities and Exchange Commission, as well as other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement.