New CMOS Image Sensor Test Solution from Advantest Lowers Test Costs with Industry-Leading 64-DUT Parallelism

High accuracy and highly parallel test capability contribute to improved throughput in cost-sensitive CMOS image sensor device production

TOKYO--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) today announced that its new CMOS image sensor test solution for its flagship SoC test system, the T2000, will be available beginning November 2010. The new solution enables highly accurate and massively parallel testing for CMOS image sensor devices to help customers lower their test cost.

CMOS image sensors are utilized in consumer electronics such as cellular phones, digital cameras, and video cameras, as well as automotive and other applications. As the widespread adoption of digital lifestyles in emerging economies continues to boom, CMOS image sensor demand is keeping pace. Rapid improvements in performance, speed, and resolution, as well as the diversification of multifunctional devices integrating CMOS image sensors, has led to increasing downward pressure on production costs. Advantest’s new CMOS image sensor test solution provides customers with 64-DUT parallel test capability – the highest in the industry – to significantly lower the cost of test.

Advantest’s new T2000 CMOS image sensor test solution incorporates a test head configured with a large optical source, and a new CMOS image sensor test module, providing illumination to an area greater than 10x that of Advantest’s previous product. Most significantly, the solution offers the industry’s first 64-DUT parallel test capability for testing image sensor devices – 8x higher than the previous product – which results in dramatically higher throughput, contributing to significant reductions in test costs.

The large CMOS image sensor measurement area enables customers add custom circuitry for their applications, without compromising parallelism. At 208mm x 252mm, the area of the new test head permits great flexibility in layout creation and device test.

Key Specifications
Parallel Test Capacity:	Max. 64 DUT
Frame Capture Speed:	1.2Gbps per lane (serial)
Image Processing (Uptake Mode):	Serial / parallel
No. of Channels:	4 channels x 4 lanes per module
Image Data Memory:	128 megapixels per channel^1

¹ A maximum of 16 frames can be captured successively when data volume is 8 million pixels.

Further information and complete specifications available at:

http://www.advantest.co.jp/products/ate/t2000/cmos/en-index.shtml

About Advantest Corporation

A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced critical dimension scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com.