Bruker AXS to Award Two $5,000 X-ray Diffraction Scholarships at Materials Research Society Fall Meeting, Tuesday, November 28th
MADISON, Wis.--(BUSINESS WIRE)--During the 2006 Materials Research Society Fall Meeting to take place at the Hynes Convention Center in Boston November 27th through December 1st, Bruker AXS, a leading global provider of advanced X-ray solutions for life and advanced materials sciences, will announce the recipients of its 2006 Excellence in X-ray Diffraction (XRD) scholarships -- based on unique experiments performed by university students. Recognizing academic achievement in X-ray Diffraction, Bruker AXS will again present a $5,000 scholarship for unique applications in the category of Nanotechnology and Materials Science and another $5,000 scholarship for the category of Geology and Chemistry. The winners have been selected by an independent panel of judges: Dr. Tom Blanton from Eastman Kodak, Dr. Jim Kaduk from Innovene and President of the International Centre for Diffraction Data, Professor Richard Matyi, College of Nanoscale Science and Engineering at UAlbany-SUNY, National Research Council Canada Research Officer Dr. Pam Whitfield, Associate Professor Scott Misture from Alfred University in New York, and Dr. Nattamai Bhuvanesh, Department of Chemistry at Texas A&M University.
“We are very pleased again this year to provide these scholarships to such extraordinary students”
The award ceremony will take place at the Bruker AXS booth, Number 406, at 5:30 PM Eastern Time on Tuesday, November 28th.
“We are very pleased again this year to provide these scholarships to such extraordinary students,” says Uwe Preckwinkel, Bruker AXS Product Manager Materials Research Solutions. “Both Bruker AXS and the judges are most impressed by the quality of the XRD experiments these students have performed, and the valuable scientific results they have obtained,” adds Dr. Frank Burgaezy, Executive Vice President of Bruker AXS in charge of the company’s global XRD and XRF business, as well as marketing.
The MRS Fall Exhibit will provide a unique opportunity to present innovative products and services to over 5,000 attendees from all sectors of the global materials science and engineering communities. For more information, please visit www.mrs.org.
X-Ray Scattering is a high-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics and semiconductors. Throughout industry and research institutions, XRS & XRD have become an indispensable method for materials investigation, characterization and quality control. Example areas of application include qualitative and quantitative phase analysis, crystallography, structure and relaxation determination, texture and residual stress investigations, controlled sample environment, micro-diffraction, nano-materials, lab- and process automation, and high-throughput polymorph screening.
Bruker AXS scientists are available at the Company’s MRS Fall Conference booth to discuss these awards and the corresponding research findings. Bruker AXS has published the above papers now in a book available to the press, MRS attendees, and other scientists.