Important Nanotechnology Advances Reported at Scientific Conference

WOODBURY, N.Y.--(BUSINESS WIRE)--Sept. 12, 2005--Veeco Instruments Inc. (Nasdaq: VECO), a leading supplier of instrumentation to the nanoscience community, announced that important nanotechnology advances were reported by leading scientists at the recently held "Seeing at the Nanoscale" Conference held mid-August in Santa Barbara, California. The conference, now in its third year, provides an ideal forum for scientists and researchers to discuss and exchange ideas on a wide variety of cutting-edge nanotechnology topics.

Craig Prater, Ph.D., Veeco's Director of New Technology Development, commented, "Over 200 leading scientists from 20 countries attended this year's event, co-sponsored by Veeco and the California NanoSystems Institute (CNSI). Our event has gotten larger and attracted more notable scientific papers and abstracts every year. We are honored that Dr. Masakazu Aono from Japan's National Institute for Materials Science was the conference's keynote speaker and are grateful to CNSI's Dr. Evelyn Hu for her guidance of this global event."

This year, several important scientific advances were discussed, including:

-- Charles Ying and Stephen Hsu, NIST - shared results of research on the fundamental mechanisms of friction, including quantitative analysis of plowing effects by sharp probe tips.

-- Martin Stolz, Maurice E Mueller Institute for Structure Biology, Basel Switzerland - presented a new AFM-based protocol for measuring the elastic properties of tissue. In addition he showed AFM images illustrating the molecular origin of loss of elasticity in cartilage due to aging;

-- Franz Giessibl, University of Augsburg EKM, Germany - reported on imaging a single atom with sub-Angstrom lateral resolution, using higher-harmonic atomic force microscopy;

-- Philipp Thurner, University of California, Santa Barbara - showed how AFM images help reveal the nanometer-scale structure of human bone, and how this furthers the efforts to develop a three-dimensional model of the complex nano-composite bone;

-- Arthur Baddorf, Oak Ridge National Laboratory - showed maps of naturally occurring piezoelectric properties in teeth and butterfly wings;

-- Georg Schitter, Instrumentation and Georg Fantner, Small Cantilevers, University of California, Santa Barbara - showed first results of a new high-speed AFM system and batch produced small cantilevers for high-speed imaging.

-- Tilman Schaffer, University of Munster - demonstrated methods of high-speed imaging of elastic properties of chromosomes and showed a dramatic video of the digestion of a chromosome viewed with this technique.

About Veeco

Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide semiconductor, data storage, HB-LED/wireless and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at

To the extent that this news release discusses expectations about market condition, market acceptance and future sales of Veeco's products, Veeco's future financial performance, future disclosures, or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the challenges of continuing weakness in end market conditions and the cyclical nature of the compound semiconductor/wireless, data storage, semiconductor and research markets, risks associated with integrating acquired businesses and the acceptance of new products by individual customers and by the marketplace and other factors discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K, subsequent Quarterly Reports on Form 10-Q and current reports on Form 8-K.


Veeco Instruments Inc.
Debra Wasser, 516-677-0200 x1472
SVP of IR and Corporate Communications
Joan Horwitz, 805-967-1400
Senior Director, Metrology Marcom

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