Veeco Receives R&D 100 Award; New Technique for Measuring Through Transparent Media Recognized for Technical Excellence

WOODBURY, N.Y.--(BUSINESS WIRE)--July 27, 2005--Veeco Instruments Inc. (NASDAQ: VECO) announced today that it has been awarded the R&D 100 Award for a new technique enabling high-resolution, interferometric measurement through glass and other transparent media. Research and Development Magazine bestows the award to the top 100 commercial products introduced in the past year that exhibit technical excellence. This award is the fifth major industry honor garnered by Veeco's optical metrology products since 2000.

"Veeco is pleased to have again been recognized by the R&D 100 panel of judges," said John Wissinger, Ph.D, V.P and Manager of Veeco's Optical and Industrial Metrology group. "We have a long history of helping our customers meet challenging measurement requirements. This award highlights a case in which Veeco responded to an industry need and developed a solution with wide applicability to some very important research and production measurements." Prior to this year, Veeco has earned eight additional R&D 100 Awards, including three for optical metrology, three for atomic force microscopy, and two for process equipment.

“We have a long history of helping our customers meet challenging measurement requirements. This award highlights a case in which Veeco responded to an industry need and developed a solution with wide applicability to some very important research and production measurements.”

Optical profiling is a standard technique for non-contact, 3D measurement of surface topography at the micro- and nano-scales. The new method for which Veeco was granted the award allows an optical profiler to characterize samples through protective packaging, environmental chamber windows, fluid cells or other transparent media, which until now was not possible. "Through-glass measurement" lets researchers see and quantify surface changes and interactions under varying environmental conditions, such as high vacuum or temperature. While initially designed for characterizing Micro Electro Mechanical Systems (MEMS), the method's utility extends to materials science, biological applications, and research into other novel devices and physical phenomena.

About Veeco

Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide data storage, LED/wireless, semiconductor and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/.

To the extent that this news release discusses expectations about market condition, market acceptance and future sales of Veeco's products, Veeco's future financial performance, or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the cyclical nature of the LED/wireless, data storage, semiconductor and research markets, risks associated with integrating acquired businesses and the acceptance of new products by individual customers and by the marketplace and other factors discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K, subsequent Quarterly Reports on Form 10-Q and current reports on Form 8-K.

Contacts

Veeco Instruments Inc.
Debra Wasser, 516-677-0200 Ext. 1472
SVP of IR and Corp. Comm.
or
Trade Media:
Joan Horwitz, 520-741-1044
Veeco Metrology, Senior Director of Marcom

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