Applied Materials’ SEMVision G4 System Wins Semiconductor
International Best Product Award
SANTA CLARA, Calif.--(BUSINESS WIRE)--Applied Materials, Inc. today announced that its Applied SEMVision™
G4 Defect Analysis platform has been honored with the prestigious
Editors' Choice Best Product Award by Semiconductor International (SI)
magazine. The winning combination of innovative technology and
production-proven performance has made the SEMVision G4 platform the
defect review tool of choice for 32nm design rules and beyond.
“In the evaluation process, SI's editors consider the
products based on feedback from actual customers in the field and only
the most highly recommended ones are honored each year.”
"The Editors' Choice Best Products awards program acknowledges products,
materials and services that are proven in the manufacturing
environment," said Laura Peters, Editor-in-Chief of Semiconductor
International. “In the evaluation process, SI's editors consider the
products based on feedback from actual customers in the field and only
the most highly recommended ones are honored each year.”
“This award recognizes the tremendous impact Applied’s SEMVision
technology has had on the semiconductor industry,” said Tom St. Dennis,
senior vice president and general manager of Applied Materials’ Silicon
Systems Group. “The SEMVision G4 system’s exceptional image quality and
advanced material analysis capabilities are powerful tools to help
chipmakers understand and mitigate the root causes of yield-killing
defects.”
The Applied Defect Review SEMVision systems are designed for the most
advanced review applications, capable of automatic defect redetection
(ADR) and automatic defect classification (ADC) of critical defects. Key
features of the SEMVision G4 technology are its new scanning electron
microscope (SEM) column and enhanced multi-perspective SEM imaging
system that deliver state-of-the-art 2nm physical resolution for
unmatched image quality at a benchmark review rate of one
defect-per-second.
The Applied SEMVision system pioneered automatic defect review in 1998,
revolutionizing the way fabs detect and analyze defect information. For
the past ten years, SEMVision technology has provided enabling
capability to the industry, with over 700 systems installed at customer
sites worldwide. This is the third SI award for Applied’s SEMVision
technology, beginning with the first SEMVision system in 2000 and
continuing with the SEMVision G2 FIB in 2005.
Applied Materials, Inc. (Nasdaq:AMAT) is the global leader in
Nanomanufacturing Technology™ solutions with a broad portfolio of
innovative equipment, service and software products for the fabrication
of semiconductor chips, flat panel displays, solar photovoltaic cells,
flexible electronics and energy efficient glass. At Applied Materials,
we apply Nanomanufacturing Technology to improve the way people live.
Learn more at www.appliedmaterials.com.
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