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The new Applied Centura AdvantEdge Etch system delivers 2mm edge exclusion with sub-3nm critical dimension control across 300mm wafers, improving transistor CD control by up to 50%. (Photo: Business Wire)

The new Applied Centura AdvantEdge Etch system delivers 2mm edge exclusion with sub-3nm critical dimension control across 300mm wafers, improving transistor CD control by up to 50%. (Photo: Business Wire)

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http://www.businesswire.com/multimedia/appliedmaterials/20050712005367/en/1201653

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