Teradyne`s New Integra FLEX Test System Selected as Next Generation Platform; Universal Slot Architecture Enables Manufacturing Flexibility for Range of Devices

BOSTON--(BUSINESS WIRE)--May 1, 2002--Teradyne, Inc. today announced that Texas Instruments has selected the recently introduced Integra FLEX test system as one of the company's key future test platforms. The selection of Integra FLEX was based on the system's Universal Slot architecture, which enables production flexibility for a wide range of devices from standard analog and power management to SOC device test.

"Factory floor flexibility improves cost, productivity and cycle time. The broad product coverage and scalability of Integra FLEX will allow TI to significantly reduce the number of test platforms used, hence improving overall flexibility," said Marc Mydill, test technology center manager at Texas Instruments. "The instrument density and architecture of Integra FLEX enable unprecedented test efficiency, particularly for mixed-signal products. We will reduce not only the number of test platforms, but the number of testers as well."

"In today's market, test performance means the capability of the tester, its production flexibility and the cost of the test solution," said Ted Quinn, Integra FLEX Product Manager, Teradyne. "With the new Integra FLEX, we have substantially improved the initial device test times for TI while increasing the number of test sites. Enabling our customers to realize test economic performance by providing a faster time to revenue at a lower cost is what the Integra FLEX is all about."

About Integra FLEX

Integra FLEX combines several test technology advancements to meet the demands of increasing device complexity and testing an increasing range of devices while breaking the cost of test barrier. A Universal Slot architecture and the Windows based IG-XL5 software redefine test system configuration flexibility on the production floor. Integra's new auto-precise Time Tracks(TM) timing system and FlexDSP introduces an unparalleled level of throughput efficiency reducing device development-to-market time for DFT and an array of devices from standard analog to SOC. The system's new technical developments are united with power analog instrumentation from Teradyne's Catalyst and second-generation 48 channel CMOS digital from the Integra J750 test system. To learn more about Integra FLEX, visit www.teradyne.com/integraflex.

About Teradyne

Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and is also a leading supplier of high performance interconnection systems. Teradyne's test products are used by manufacturers of semiconductors, circuit assemblies, voice and broadband telephone networks. Teradyne's backplane assemblies and high-density connectors are used by manufacturers of communications and computing systems central to building networking infrastructure. The company had sales of $1.4 billion in 2001 and currently employs about 8000 people worldwide. For more information visit www.teradyne.com.

Time Tracks is a trademark of Teradyne, Inc.

“Factory floor flexibility improves cost, productivity and cycle time. The broad product coverage and scalability of Integra FLEX will allow TI to significantly reduce the number of test platforms used, hence improving overall flexibility”