"Nepcon Shanghai is an ideal opportunity for us to demonstrate the breadth and depth of Teradyne's unique product range," said Patrick Tong, General Manager of Teradyne Asia. "Teradyne provides electronics manufacturers with leading edge test and inspection solutions to overcome today's design, manufacturing and test challenges, and deliver technologically distinctive products to their markets faster and more cost effectively than the competition."
"Our hardware and software offerings provide electronics manufacturers with the most comprehensive and effectual range of test and inspection solutions available and they allow manufacturers to focus on achieving precise test requirements more cost effectively," Tong added. "While we have worked with original equipment and contract electronics manufacturers throughout the Asia-Pacific region for many years, Nepcon in Shanghai is a special opportunity to introduce the most complete portfolio of test and inspection solutions in the industry to an even wider audience."
Teradyne will be featuring the following test and inspection solutions at Nepcon Shanghai:
-- Optima(TM) 7200 Post-Placement Automated Optical Inspection System
-- Optima 7300 Post-Reflow Automated Optical Inspection System
-- GR TestStation(TM) 124 ICT Board Test
-- GR Versa(TM) Cell Phone In-Process Test Solution
-- XStation 130L(TM) Manual X-Ray Inspection Solution
Optima 7200 Post-Placement AOI System
Teradyne's Optima 7200 monitors placement equipment to minimize defects, boost yield, and cut repair costs while matching the line beat rates required for high-volume production.
Optima 7300 Post-Reflow AOI System
Teradyne's Optima 7300 is the fastest automated inspection system available today, able to keep up with the highest-capacity surface mount lines with a single AOI system. The Optima 7300 features a new, high-speed x-y positioning gantry and new image detection and acquisition architecture that complete the scan, diagnosis, and board handling cycle at greater than twice the speed or more of competing alternatives
GR TestStation TS 124 In-Circuit Test System
Designed for high volume manufacturing lines that require fast throughput, Teradyne's GR TestStation TS 124 is an all-real pin in-circuit test system, providing full test resources for every node of a board. The GR TestStation(TM) is designed to meet the growing technological challenges for tighter voltage levels, accurate test voltages and more useable digital resources.
GR Versa Cell Phone In-Process Test Solution
The GR Versa Cell Phone In-Process Test Solution provides the user the ability to perform complex transmitter and receiver measurements at the circuit board level using a protocol independent test strategy. By bypassing the normal time-consuming phone-to-base station protocol, GR Versa exhibits test times that can be 30% faster than normal test methods.
Manual X-ray Inspection
The XStation 130L provides manufacturers with affordable, full-featured inspection tools that are ideal for 100% inspection of area-array and SMT devices. All MXI systems are also an excellent match to Teradyne Rework Systems for repair verification
About Teradyne
Teradyne (NYSE: TER) is the world's largest supplier of automatic test equipment and is also a leading supplier of high performance interconnection systems. Teradyne's test products are used by manufacturers of semiconductors, circuit assemblies, voice and broadband telephone networks. Teradyne's backplane assemblies and high-density connectors are used by manufacturers of communications and computing systems central to building networking infrastructure. The company had sales of $1.4 billion in 2001 and currently employs about 8000 people worldwide. For more information visit www.teradyne.com.
“While we have worked with original equipment and contract electronics manufacturers throughout the Asia-Pacific region for many years, Nepcon in Shanghai is a special opportunity to introduce the most complete portfolio of test and inspection solutions in the industry to an even wider audience.”

