Teradyne Introduces New Radio Frequency Identification Option Available with the INTEGRA J750 Test System

ATLANTIC CITY, N.J.--(BUSINESS WIRE)--Oct. 3, 2000--Teradyne's Integra Test Division introduced today the new INTEGRA J750 Radio Frequency Identification Option (RFID), which is being demonstrated this week at the International Test Conference (see Booth #903). The RFID Option is ideal for testing RFID interfaces integrated into VLSI devices like smartcards and I.D. tag applications. These devices are commonly found in banking, telephone, health insurance cards and luggage tags as well as a variety of other applications. STMicroelectronics will be the first customer to receive the RFID Option, which will be delivered to the company's facility in Rousset, France in Q4 2000.

The INTEGRA J750 RFID Option provides 16 bi-directional RFID channels including transmitter and receiver path with synchronization and DSP units. A single RFID board can support parallel test up to 16 sites, two may support up to 32 sites. Teradyne provides a complete, economical test solution with no additional hardware interfaces needed to test these types of devices more accurately and efficiently.

Martin Stadler, Teradyne Product Manager for the J750 RFID Option, said, "We recognize how rapidly this market is evolving by offering a specific test solution for these type of ICs. Because lowering the cost of test is also crucial for this market segment, the RFID Option can synchronize the response of 16 or 32 devices. Today, we are the only ATE vendor capable of testing up to 32 devices with embedded RFID interfaces. We will continue to add options and capabilities to the J750 to meet the needs of our customers and increase the value of their investment."

At ITC this week, Teradyne is showing the new RFID Option on a 1024 pin J750 test system. The demo will show the following:

--	True parallel test of 4 Smartcard ICs
--	Capture capability of the modulated RFID signal for device

analysis.

-- Complete IG-XL software integration (Templates, Visual Basic, spreadsheet programming)

About the INTEGRA J750

The INTEGRA J750 delivers up to 1,024 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities help deliver 95% parallel test efficiency for up to 32 devices. The system offers a suite of options to address the variation of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Scan Test Option, RFID Option , Redundancy Analysis, and Mixed Signal Option.

The system also features IG-XL test software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

About Teradyne

Teradyne is the world's leading automated testing company for the electronics, communications, and software industries. Its products and services address the test requirements of a broad range of semiconductors, electronic assemblies, telephone access networks and software applications. Teradyne is also a leading supplier of backplane and interconnect systems for the electronics and communications industries. Headquartered in Boston, Massachusetts, Teradyne had 1999 sales of $1.8 billion and currently employs about 8500 people worldwide. Its stock is listed on the New York Stock Exchange under the symbol TER. Teradyne's World Wide Web address is www.teradyne.com.