Calculating Damages Resulting From Patent Infringement (Atlanta, GA, United States - December 15, 2017) - Research and Markets

DUBLIN--()--The "Calculating Damages Resulting From Patent Infringement" conference has been added to Research and Markets' offering.

Patent assertion is a high stakes game. When tens or hundreds of millions of dollars are at stake, you must make the most powerful argument possible in seeking patent damages. In addition to discussing a host of creative damages theories, this course will review basic tenets of patent infringement such as:

  • Lost Profits
  • Price Erosion
  • Entire Market Value Rule
  • FRAND Damages
  • Apportionment
  • The Analytical Method
  • Market Spoilage
  • The Georgia-Pacific Factors
  • The 25% Rule
  • Cost of Next Best Alternatives
  • Running Royalties vs. Upfront Payments
  • Cost of Designing Around
  • Compulsory Licenses
  • Anti-Trust Issues

This course will also discuss relevant court ruling such as:

  • Alice Corp. v. CLS Bank International
  • Octane Fitness v. ICON Health and Fitness
  • Ericson v. Apple
  • Commil USA v. Cisco Systems
  • Kimble v. Marvel Entertainment
  • Panduit v. Stahlin Bros. Fibre Works
  • State Industries v. Mor-Flo Industries
  • Summit 6 v. Samsung
  • Uniloc v Microsoft
  • Grain Processing v. American Maize Products
  • Halo Electronics v. Pulse Electronics
  • Carnegie Mellon University v. Marvel Technology Group
  • Cornell University v. Hewlett-Packard

For more information about this conference visit https://www.researchandmarkets.com/research/ttx244/calculating

Contacts

Research and Markets
Laura Wood, Senior Manager
press@researchandmarkets.com
For E.S.T Office Hours Call 1-917-300-0470
For U.S./CAN Toll Free Call 1-800-526-8630
For GMT Office Hours Call +353-1-416-8900
Related Topics: Patents

Contacts

Research and Markets
Laura Wood, Senior Manager
press@researchandmarkets.com
For E.S.T Office Hours Call 1-917-300-0470
For U.S./CAN Toll Free Call 1-800-526-8630
For GMT Office Hours Call +353-1-416-8900
Related Topics: Patents