Research and Markets: Amplitude Modulation Atomic Force Microscopy

DUBLIN--(BUSINESS WIRE)--Research and Markets (http://www.researchandmarkets.com/research/c5a5b6/amplitude_modulati) has announced the addition of John Wiley and Sons Ltd's new book "Amplitude Modulation Atomic Force Microscopy" to their offering.

Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.

About the Author:

Ricardo Garcia is Professor at the Instituto de Microelectroni-ca de Madrid (CSIC), one of the Institutes of the Spanish Council for Scientific Research. He received his PhD degree in physics from the Universidad Autonoma de Madrid in 1990. From 1990 to 1993 he was a post-doctoral associate at the Universities of New Mexico and Oregon. Professor Garcia is author and co-author of 104 articles and 14 book chapters, and has contributed some highly regarded papers on the development and optimization of amplitude modulation AFM (tapping mode AFM) as well as on the emergence of scanning probe nanolithographies. In 2007, Professor Garcia was elected a Fellow of the American Physical Society.

Key Topics Covered:

• Instrumental and Conceptual Aspects
• Tip-surface interaction forces
• Theory of amplitude modulation AFM
• Advanced theory of amplitude modulation AFM
• Amplitude modulation AFM in liquid
• Phase imaging atomic force microscopy
• Resolution, noise and sensitivity
• Multifrequency atomic force microscopy
• Beyond topographic imaging

For more information visit http://www.researchandmarkets.com/research/c5a5b6/amplitude_modulati