Zoughi to Receive 2011 IEEE Joseph F. Keithley Award for Contributions to Microwave and Millimeter Wave Measurement Techniques

CLEVELAND--(BUSINESS WIRE)--The IEEE has named Dr. Reza Zoughi as the recipient of the 2011 IEEE Joseph F. Keithley Award in Instrumentation and Measurement. Zoughi is being recognized for his contributions to microwave and millimeter wave measurement techniques for nondestructive testing and evaluation. The award, sponsored by Keithley Instruments, Inc. (NYSE:KEI), is presented for outstanding contributions in the field of electrical measurement. It consists of a bronze medal, a certificate, and an honorarium. The award will be presented to Zoughi on May 11, 2011, during the IEEE International Instrumentation and Measurement Technology Conference, which will be held at the Four Points by Sheraton Hangzhou, Binjiang, Hangzhou, China.

Zoughi, a Fellow of the Institute of Electrical and Electronics Engineers (IEEE), received his B.S.E.E, M.S.E.E, and Ph.D. degrees in electrical engineering (radar remote sensing, radar systems, and microwaves) from the University of Kansas. Currently, he is the Schlumberger Distinguished Professor of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T, formerly University of Missouri-Rolla). Zoughi’s efforts, in the past two decades, in expanding the utility of microwave and millimeter wave inspection techniques have brought significant recognition to the field of Nondestructive Testing and Evaluation (NDT&E). Zoughi’s research team has developed millimeter wave imaging systems and methods for inspecting the spray-on foam insulation (SOFI) of the space shuttle’s external fuel tank, in addition to a real-time, high-resolution and portable microwave camera that is expected to find widespread utility. He has played a leading role in developing near-field microwave and millimeter wave techniques and developed near-field measurement systems using open-ended waveguide and other more sophisticated probes for evaluating a host of defects in thin and thick and layered composite structures.

Criteria considered by the award's IEEE Evaluation Committee include innovation or development, social value, uniqueness of concept, other technical accomplishments, and the quality of the nomination. The award is administered through the Technical Field Awards Council of the IEEE Awards Board and is independent of Keithley Instruments. For additional information on IEEE Technical Field Awards and Medals, to view complete lists of past recipients, or to nominate a colleague or associate for IEEE Technical Field Awards and Medals, please visit http://www.ieee.org/awards.

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With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

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